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Conference on Stress-induced Phenomena In Metallization

Detalles Bibliográficos
Autores principales: Bravman, John, Ho, Paul S, Li, Che-Yu, Sanchez, John
Lenguaje:eng
Publicado: AIP 1996
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/866264
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author Bravman, John
Ho, Paul S
Li, Che-Yu
Sanchez, John
author_facet Bravman, John
Ho, Paul S
Li, Che-Yu
Sanchez, John
author_sort Bravman, John
collection CERN
id cern-866264
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1996
publisher AIP
record_format invenio
spelling cern-8662642021-04-25T17:28:01Zhttp://cds.cern.ch/record/866264engBravman, JohnHo, Paul SLi, Che-YuSanchez, JohnConference on Stress-induced Phenomena In MetallizationXXAIPoai:cds.cern.ch:8662641996
spellingShingle XX
Bravman, John
Ho, Paul S
Li, Che-Yu
Sanchez, John
Conference on Stress-induced Phenomena In Metallization
title Conference on Stress-induced Phenomena In Metallization
title_full Conference on Stress-induced Phenomena In Metallization
title_fullStr Conference on Stress-induced Phenomena In Metallization
title_full_unstemmed Conference on Stress-induced Phenomena In Metallization
title_short Conference on Stress-induced Phenomena In Metallization
title_sort conference on stress-induced phenomena in metallization
topic XX
url http://cds.cern.ch/record/866264
work_keys_str_mv AT bravmanjohn conferenceonstressinducedphenomenainmetallization
AT hopauls conferenceonstressinducedphenomenainmetallization
AT licheyu conferenceonstressinducedphenomenainmetallization
AT sanchezjohn conferenceonstressinducedphenomenainmetallization