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Simulation of an electron source based calibrating system for an ionisation profile monitor
Measurements have shown that the gain of the imaging system of the Ionisation Profile Monitor (IPM) changes over time, in a non-homogenous way. This ageing effect is caused by changes in the Micro Channel Plate (MCP) channel wall secondary emission coefficient, due to electron scrubbing. The MCP is...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
2005
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/895156 |