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Test beam results of a large area strip detector made on high resistivity Czochralski silicon
We have tested the detection performance of a strip detector processed on silicon wafer grown by magnetic Czochralski (MCZ) method. This is the first time a full size Czochralski detector has been tested in a beam, although the advantages of CZ silicon have been known before. Prior to test beam meas...
Autores principales: | , , , , , , , , , , , , , , , , , , , |
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Lenguaje: | eng |
Publicado: |
2003
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/S0920-5632(03)02241-2 http://cds.cern.ch/record/909057 |