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Test beam results of a large area strip detector made on high resistivity Czochralski silicon

We have tested the detection performance of a strip detector processed on silicon wafer grown by magnetic Czochralski (MCZ) method. This is the first time a full size Czochralski detector has been tested in a beam, although the advantages of CZ silicon have been known before. Prior to test beam meas...

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Detalles Bibliográficos
Autores principales: Tuominen, E, Banzuzi, K, Czellar, S, Härkönen, J, Heikkinen, A M, Johansson, P, Karimäki, V, Luukka, Panja, Mehtälä, P, Niku, J, Nummela, S, Nysten, J, Simpura, J, Tuominiemi, J, Tuovinen, E, Ungaro, D, Vaarala, T, Voutilainen, M, Wendland, L, Zibellini, A
Lenguaje:eng
Publicado: 2003
Materias:
Acceso en línea:https://dx.doi.org/10.1016/S0920-5632(03)02241-2
http://cds.cern.ch/record/909057
Descripción
Sumario:We have tested the detection performance of a strip detector processed on silicon wafer grown by magnetic Czochralski (MCZ) method. This is the first time a full size Czochralski detector has been tested in a beam, although the advantages of CZ silicon have been known before. Prior to test beam measurements, the electrical characteristics of the Czochralski silicon detectors were found to be appropriate for particle detection. Using the Helsinki silicon beam telescope at CERN H2 test beam, the performance of the Czochralski silicon detector was shown to be comparable with the existing silicon strip detectors.