Test beam results of a large area strip detector made on high resistivity Czochralski silicon

We have tested the detection performance of a strip detector processed on silicon wafer grown by magnetic Czochralski (MCZ) method. This is the first time a full size Czochralski detector has been tested in a beam, although the advantages of CZ silicon have been known before. Prior to test beam meas...

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Detalles Bibliográficos
Autores principales: Tuominen, E, Banzuzi, K, Czellar, S, Härkönen, J, Heikkinen, A M, Johansson, P, Karimäki, V, Luukka, Panja, Mehtälä, P, Niku, J, Nummela, S, Nysten, J, Simpura, J, Tuominiemi, J, Tuovinen, E, Ungaro, D, Vaarala, T, Voutilainen, M, Wendland, L, Zibellini, A
Lenguaje:eng
Publicado: 2003
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/S0920-5632(03)02241-2
http://cds.cern.ch/record/909057

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