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23rd International Conference on Defects in Semiconductors
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
2006
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/944561 |
| _version_ | 1780909882045628416 |
|---|---|
| author | Oshiyama, A Maeda, KA Ithon, K M Katayama-Yoshida, H |
| author_facet | Oshiyama, A Maeda, KA Ithon, K M Katayama-Yoshida, H |
| author_sort | Oshiyama, A |
| collection | CERN |
| id | cern-944561 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2006 |
| record_format | invenio |
| spelling | cern-9445612021-07-30T13:15:47Z http://cds.cern.ch/record/944561 eng Oshiyama, A Maeda, KA Ithon, K M Katayama-Yoshida, H 23rd International Conference on Defects in Semiconductors XX 2006 |
| spellingShingle | XX Oshiyama, A Maeda, KA Ithon, K M Katayama-Yoshida, H 23rd International Conference on Defects in Semiconductors |
| title | 23rd International Conference on Defects in Semiconductors |
| title_full | 23rd International Conference on Defects in Semiconductors |
| title_fullStr | 23rd International Conference on Defects in Semiconductors |
| title_full_unstemmed | 23rd International Conference on Defects in Semiconductors |
| title_short | 23rd International Conference on Defects in Semiconductors |
| title_sort | 23rd international conference on defects in semiconductors |
| topic | XX |
| url | http://cds.cern.ch/record/944561 |
| work_keys_str_mv | AT oshiyamaa 23rdinternationalconferenceondefectsinsemiconductors AT maedaka 23rdinternationalconferenceondefectsinsemiconductors AT ithonkm 23rdinternationalconferenceondefectsinsemiconductors AT katayamayoshidah 23rdinternationalconferenceondefectsinsemiconductors |