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An Analysis of the Expected Degradation of Silicon Detectors in the Future Ultra High Energy Facilities
In this contribution we discuss how to prepare some possible detectors - only silicon option being considered, for the new era of HEP challenges because the bulk displacement damage in the detector, consequence of irradiation, produces effects at the device level that limit their long time utilisati...
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
2006
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1142/9789812773678_0132 http://cds.cern.ch/record/997925 |