A charge collection study with dedicated RD50 charge multiplication sensors

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This study investigates the charge collection efficiency of silicon strip detectors, produced by MICRON Semiconductor Co., Ltd. within the CERN RD50 collaboration, designed specifically to understand the effect of design parameters on the onset and magnitude of charge multiplication. Charge collecti...

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Detalles Bibliográficos
Autores principales: Betancourt, C, Barber, T, Hauser, M, Jakobs, K, Kuehn, S, Parzefall, U, Wonsak, S
Lenguaje:eng
Publicado: 2013
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2013.05.186
http://cds.cern.ch/record/2634364

Internet

https://dx.doi.org/10.1016/j.nima.2013.05.186
http://cds.cern.ch/record/2634364

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