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A charge collection study with dedicated RD50 charge multiplication sensors
This study investigates the charge collection efficiency of silicon strip detectors, produced by MICRON Semiconductor Co., Ltd. within the CERN RD50 collaboration, designed specifically to understand the effect of design parameters on the onset and magnitude of charge multiplication. Charge collecti...
Autores principales: | Betancourt, C, Barber, T, Hauser, M, Jakobs, K, Kuehn, S, Parzefall, U, Wonsak, S |
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Lenguaje: | eng |
Publicado: |
2013
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2013.05.186 http://cds.cern.ch/record/2634364 |
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