Low-resistance strip sensors for beam-loss event protection

AC-coupled silicon strip sensors can be damaged in case of a beam loss due to the possibility of a large charge accumulation in the bulk, developing very high voltages across the coupling capacitors which can destroy them. Punch-through structures are currently used to avoid this problem helping to...

Descripción completa

Detalles Bibliográficos
Autores principales: Ullán, M, Benítez, V, Quirion, D, Zabala, M, Pellegrini, G, Lozano, M, Lacasta, C, Soldevila, U, García, C, Fadeyev, V, Wortman, J, DeFilippis, J, Shumko, M, Grillo, A A, Sadrozinski, H F -W
Lenguaje:eng
Publicado: 2014
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2014.05.089
http://cds.cern.ch/record/2025831

Internet

https://dx.doi.org/10.1016/j.nima.2014.05.089
http://cds.cern.ch/record/2025831

Ejemplares similares