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Charge collection studies in irradiated HV-CMOS particle detectors
Charge collection properties of particle detectors made in HV-CMOS technology were investigated before and after irradiation with reactor neutrons. Two different sensor types were designed and processed in 180 and 350 nm technology by AMS. Edge-TCT and charge collection measurements with electrons f...
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语言: | eng |
出版: |
IOP
2016
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主题: | |
在线阅读: | https://dx.doi.org/10.1088/1748-0221/11/04/P04007 http://cds.cern.ch/record/2710025 |