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Radiation Tolerance of Programmable Voltage Supply and High Galvanic Insulation Readout Electronics Used by CERN's LHC Cryogenics
Two different types of electronic cards have been tested in CERN's CHARM irradiation facility. The irradiation results confirmed the appropriate selection of the integrated circuits and validated the final productions.
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
2015
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/RADECS.2015.7365654 http://cds.cern.ch/record/2159240 |