Radiation Tolerance of Programmable Voltage Supply and High Galvanic Insulation Readout Electronics Used by CERN's LHC Cryogenics

Two different types of electronic cards have been tested in CERN's CHARM irradiation facility. The irradiation results confirmed the appropriate selection of the integrated circuits and validated the final productions.

Detalles Bibliográficos
Autores principales: Casas, J, Trikoupis, N, Mekki, J
Lenguaje:eng
Publicado: 2015
Materias:
Accelerators and Storage Rings
Acceso en línea:https://dx.doi.org/10.1109/RADECS.2015.7365654
http://cds.cern.ch/record/2159240
Descripción
Sumario:Two different types of electronic cards have been tested in CERN's CHARM irradiation facility. The irradiation results confirmed the appropriate selection of the integrated circuits and validated the final productions.

Ejemplares similares