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Characterizing Supersonic Gas Jet-based Beam Profile Monitors

The next generation of high power, high intensity accelerators requires non-invasive diagnostics, particularly beam profile monitors. Residual gas-based diagnostics such as ionization beam profile or beam induced fluorescence monitors have been used to replace commonly used scintillating screens. At...

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Detalles Bibliográficos
Autores principales: Zhang, Hao, Alexandrova, Alexandra, Jeff, Adam, Tzoganis, Vasilis, Welsch, Carsten
Lenguaje:eng
Publicado: 2016
Materias:
Acceso en línea:https://dx.doi.org/10.18429/JACoW-IPAC2016-MOPMR046
http://cds.cern.ch/record/2207319