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Characterizing Supersonic Gas Jet-based Beam Profile Monitors
The next generation of high power, high intensity accelerators requires non-invasive diagnostics, particularly beam profile monitors. Residual gas-based diagnostics such as ionization beam profile or beam induced fluorescence monitors have been used to replace commonly used scintillating screens. At...
Autores principales: | Zhang, Hao, Alexandrova, Alexandra, Jeff, Adam, Tzoganis, Vasilis, Welsch, Carsten |
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Lenguaje: | eng |
Publicado: |
2016
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.18429/JACoW-IPAC2016-MOPMR046 http://cds.cern.ch/record/2207319 |
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