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CHARM: A Mixed Field Facility at CERN for Radiation Tests in Ground, Atmospheric, Space and Accelerator Representative Environments
Depending on the application, electronic systems and devices can be subjected to different radiation environments. According to the type of radiation encountered during operation, electronic components are simultaneously vulnerable to cumulative and single event effects. In addition, inelastic inter...
| Autores principales: | , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2016
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/TNS.2016.2528289 http://cds.cern.ch/record/2265305 |