Impact of GigaRad Ionizing Dose on 28 nm bulk MOSFETs for future HL-LHC

The Large Hadron Collider (LHC) running at CERN will soon be upgraded to increase its luminosity giving rise to radiations reaching the level of GigaRad Total Ionizing Dose (TID). This paper investigates the impact of such high radiation on transistors fabricated in a commercial 28 nm bulk CMOS proc...

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Detalles Bibliográficos
Autores principales: Pezzotta, A, Zhang, C M, Jazaeri, F, Bruschini, C, Borghello, G, Faccio, F, Mattiazzo, S, Baschirotto, A, Enz, C
Lenguaje:eng
Publicado: 2016
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1109/ESSDERC.2016.7599608
http://cds.cern.ch/record/2262307

Internet

https://dx.doi.org/10.1109/ESSDERC.2016.7599608
http://cds.cern.ch/record/2262307

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