Methodologies for the Statistical Analysis of Memory Response to Radiation

Methodologies are proposed for in-depth statistical analysis of Single Event Upset data. The motivation for using these methodologies is to obtain precise information on the intrinsic defects and weaknesses of the tested devices, and to gain insight on their failure mechanisms, at no additional cost...

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Detalles Bibliográficos
Autores principales: Bosser, Alexandre L, Gupta, Viyas, Tsiligiannis, Georgios, Frost, Christopher D, Zadeh, Ali, Jaatinen, Jukka, Javanainen, Arto, Puchner, Helmut, Saigne, Frederic, Virtanen, Ari, Wrobel, Frederic, Dilillo, Luigi
Lenguaje:eng
Publicado: 2016
Materias:
Other
Acceso en línea:https://dx.doi.org/10.1109/TNS.2016.2527781
http://cds.cern.ch/record/2268229

Internet

https://dx.doi.org/10.1109/TNS.2016.2527781
http://cds.cern.ch/record/2268229

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