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Substrate-currents-aware characterization of an integrated buck DC/DC converter for floor-plan optimization
The performance of integrated DC/DC converters is affected by substrate parasitic devices, such as bipolar transistors and thyristors: these devices cause enhanced substrate noise that can lead to the malfunctioning of the control circuitry, they degrade the efficiency, and thyristors can even cause...
| Autores principales: | , , , , |
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| Lenguaje: | eng |
| Publicado: |
2017
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/NEWCAS.2017.8010132 http://cds.cern.ch/record/2303665 |