Cargando…
Preparation and characterization of $^{33}$S samples for $^{33}$S(n,$\alpha$) $^{30}$Si cross-section measurements at the n_TOF facility at CERN
Thin $^{33}$S samples for the study of the $^{33}$S(n,$\alpha$)$^{30}$Si cross-section at the n_TOF facility at CERN were made by thermal evaporation of $^{33}$S powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for t...
Autores principales: | , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , |
---|---|
Lenguaje: | eng |
Publicado: |
2018
|
Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2018.02.055 http://cds.cern.ch/record/2643836 |