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Preparation and characterization of $^{33}$S samples for $^{33}$S(n,$\alpha$) $^{30}$Si cross-section measurements at the n_TOF facility at CERN
Thin $^{33}$S samples for the study of the $^{33}$S(n,$\alpha$)$^{30}$Si cross-section at the n_TOF facility at CERN were made by thermal evaporation of $^{33}$S powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for t...
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