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A beam scanner for the OMICRON experiment at CERN

Detalles Bibliográficos
Autor principal: van der Graaf, Hendrik
Lenguaje:eng
Publicado: 2018
Materias:
Acceso en línea:http://cds.cern.ch/record/2306228
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author van der Graaf, Hendrik
author_facet van der Graaf, Hendrik
author_sort van der Graaf, Hendrik
collection CERN
id oai-inspirehep.net-1657521
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2018
record_format invenio
spelling oai-inspirehep.net-16575212019-09-30T06:29:59Zhttp://cds.cern.ch/record/2306228engvan der Graaf, HendrikA beam scanner for the OMICRON experiment at CERNDetectors and Experimental Techniquesoai:inspirehep.net:16575212018-02-28T05:20:03Z
spellingShingle Detectors and Experimental Techniques
van der Graaf, Hendrik
A beam scanner for the OMICRON experiment at CERN
title A beam scanner for the OMICRON experiment at CERN
title_full A beam scanner for the OMICRON experiment at CERN
title_fullStr A beam scanner for the OMICRON experiment at CERN
title_full_unstemmed A beam scanner for the OMICRON experiment at CERN
title_short A beam scanner for the OMICRON experiment at CERN
title_sort beam scanner for the omicron experiment at cern
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/2306228
work_keys_str_mv AT vandergraafhendrik abeamscannerfortheomicronexperimentatcern
AT vandergraafhendrik beamscannerfortheomicronexperimentatcern