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A beam scanner for the OMICRON experiment at CERN
Autor principal: | |
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Lenguaje: | eng |
Publicado: |
2018
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2306228 |
_version_ | 1780957652292993024 |
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author | van der Graaf, Hendrik |
author_facet | van der Graaf, Hendrik |
author_sort | van der Graaf, Hendrik |
collection | CERN |
id | oai-inspirehep.net-1657521 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2018 |
record_format | invenio |
spelling | oai-inspirehep.net-16575212019-09-30T06:29:59Zhttp://cds.cern.ch/record/2306228engvan der Graaf, HendrikA beam scanner for the OMICRON experiment at CERNDetectors and Experimental Techniquesoai:inspirehep.net:16575212018-02-28T05:20:03Z |
spellingShingle | Detectors and Experimental Techniques van der Graaf, Hendrik A beam scanner for the OMICRON experiment at CERN |
title | A beam scanner for the OMICRON experiment at CERN |
title_full | A beam scanner for the OMICRON experiment at CERN |
title_fullStr | A beam scanner for the OMICRON experiment at CERN |
title_full_unstemmed | A beam scanner for the OMICRON experiment at CERN |
title_short | A beam scanner for the OMICRON experiment at CERN |
title_sort | beam scanner for the omicron experiment at cern |
topic | Detectors and Experimental Techniques |
url | http://cds.cern.ch/record/2306228 |
work_keys_str_mv | AT vandergraafhendrik abeamscannerfortheomicronexperimentatcern AT vandergraafhendrik beamscannerfortheomicronexperimentatcern |