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Wafer Tests of the Pixel Detectors for the Upgrade of the DELPHI Vertex Detector
Autores principales: | de Boer, W, Hartmann, F, Kaiser, M, Knoblauch, D, K\"orpert, A, Leb, H, Maehlum, G, Meyer, S, Wielers, M |
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Lenguaje: | eng |
Publicado: |
1996
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Acceso en línea: | http://cds.cern.ch/record/2630043 |
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