Radiation Effects on Deep Submicrometer SRAM-based FPGAs under the CERN Mixed-Field Radiation Environment

In this paper, the single-event effects on a 28-nm static random access memory-based field-programmable gate array (FPGA) under CERN’s mixed-particle field are analyzed. The methodology followed for CERN electronics radiation hard- ness assurance and the particularities of testing an FPGA under a mi...

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Detalles Bibliográficos
Autores principales: Tsiligiannis, G, Danzeca, S, Garcia-Alia, R, Infantino, A, Lesea, A, Brugger, M, Masi, A, Gilardoni, S, Saigné, F
Lenguaje:eng
Publicado: 2018
Materias:
Accelerators and Storage Rings
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1109/TNS.2018.2806450
http://cds.cern.ch/record/2641298

Internet

https://dx.doi.org/10.1109/TNS.2018.2806450
http://cds.cern.ch/record/2641298

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