Cargando…
Radiation Effects on Deep Submicrometer SRAM-based FPGAs under the CERN Mixed-Field Radiation Environment
In this paper, the single-event effects on a 28-nm static random access memory-based field-programmable gate array (FPGA) under CERN’s mixed-particle field are analyzed. The methodology followed for CERN electronics radiation hard- ness assurance and the particularities of testing an FPGA under a mi...
| Autores principales: | , , , , , , , , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
2018
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/TNS.2018.2806450 http://cds.cern.ch/record/2641298 |