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Electromigration driven failures on miniature silver fuses at the Large Hadron Collider

Spurious faults were observed on the miniature silver fuses of electronic cards used for the cryogenics instrumentation in the LHC (Large Hadron Collider) accelerator at CERN. By applying analytical tools and techniques such as Scanning Electron Microscopy, spectrometry and Weibull reliability calcu...

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Detalles Bibliográficos
Autores principales: Trikoupis, Nikolaos, Casas, Juan, Perez Fontenla, Ana Teresa
Lenguaje:eng
Publicado: SISSA 2017
Materias:
Acceso en línea:https://dx.doi.org/10.22323/1.313.0066
http://cds.cern.ch/record/2312400