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Electromigration driven failures on miniature silver fuses at the Large Hadron Collider

Spurious faults were observed on the miniature silver fuses of electronic cards used for the cryogenics instrumentation in the LHC (Large Hadron Collider) accelerator at CERN. By applying analytical tools and techniques such as Scanning Electron Microscopy, spectrometry and Weibull reliability calcu...

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Autores principales: Trikoupis, Nikolaos, Casas, Juan, Perez Fontenla, Ana Teresa
Lenguaje:eng
Publicado: SISSA 2017
Materias:
Acceso en línea:https://dx.doi.org/10.22323/1.313.0066
http://cds.cern.ch/record/2312400
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author Trikoupis, Nikolaos
Casas, Juan
Perez Fontenla, Ana Teresa
author_facet Trikoupis, Nikolaos
Casas, Juan
Perez Fontenla, Ana Teresa
author_sort Trikoupis, Nikolaos
collection CERN
description Spurious faults were observed on the miniature silver fuses of electronic cards used for the cryogenics instrumentation in the LHC (Large Hadron Collider) accelerator at CERN. By applying analytical tools and techniques such as Scanning Electron Microscopy, spectrometry and Weibull reliability calculations and by the knowledge of operating temperatures and operational time of each unit, the origin of the problem has now been understood and can be attributed to electromigration. The selected fuse was operated at moderate temperature and load conditions and was considered as a “lifetime” component. However, it turned out to have a smaller than expected MTTF with failures following a Weibull distribution of $\beta = 3.91$ and $\eta = 2323$. The literature describes extensively the effects of electromigration, but there are only limited references referring to the impact of this phenomenon on miniature silver fuses for electronic circuits.
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institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2017
publisher SISSA
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spelling oai-inspirehep.net-16650282020-12-14T13:46:14Zdoi:10.22323/1.313.0066http://cds.cern.ch/record/2312400engTrikoupis, NikolaosCasas, JuanPerez Fontenla, Ana TeresaElectromigration driven failures on miniature silver fuses at the Large Hadron ColliderDetectors and Experimental TechniquesSpurious faults were observed on the miniature silver fuses of electronic cards used for the cryogenics instrumentation in the LHC (Large Hadron Collider) accelerator at CERN. By applying analytical tools and techniques such as Scanning Electron Microscopy, spectrometry and Weibull reliability calculations and by the knowledge of operating temperatures and operational time of each unit, the origin of the problem has now been understood and can be attributed to electromigration. The selected fuse was operated at moderate temperature and load conditions and was considered as a “lifetime” component. However, it turned out to have a smaller than expected MTTF with failures following a Weibull distribution of $\beta = 3.91$ and $\eta = 2323$. The literature describes extensively the effects of electromigration, but there are only limited references referring to the impact of this phenomenon on miniature silver fuses for electronic circuits.SISSAoai:inspirehep.net:16650282017
spellingShingle Detectors and Experimental Techniques
Trikoupis, Nikolaos
Casas, Juan
Perez Fontenla, Ana Teresa
Electromigration driven failures on miniature silver fuses at the Large Hadron Collider
title Electromigration driven failures on miniature silver fuses at the Large Hadron Collider
title_full Electromigration driven failures on miniature silver fuses at the Large Hadron Collider
title_fullStr Electromigration driven failures on miniature silver fuses at the Large Hadron Collider
title_full_unstemmed Electromigration driven failures on miniature silver fuses at the Large Hadron Collider
title_short Electromigration driven failures on miniature silver fuses at the Large Hadron Collider
title_sort electromigration driven failures on miniature silver fuses at the large hadron collider
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.22323/1.313.0066
http://cds.cern.ch/record/2312400
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