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Electromigration driven failures on miniature silver fuses at the Large Hadron Collider
Spurious faults were observed on the miniature silver fuses of electronic cards used for the cryogenics instrumentation in the LHC (Large Hadron Collider) accelerator at CERN. By applying analytical tools and techniques such as Scanning Electron Microscopy, spectrometry and Weibull reliability calcu...
Autores principales: | , , |
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Lenguaje: | eng |
Publicado: |
SISSA
2017
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.22323/1.313.0066 http://cds.cern.ch/record/2312400 |
_version_ | 1780958015289032704 |
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author | Trikoupis, Nikolaos Casas, Juan Perez Fontenla, Ana Teresa |
author_facet | Trikoupis, Nikolaos Casas, Juan Perez Fontenla, Ana Teresa |
author_sort | Trikoupis, Nikolaos |
collection | CERN |
description | Spurious faults were observed on the miniature silver fuses of electronic cards used for the cryogenics instrumentation in the LHC (Large Hadron Collider) accelerator at CERN. By applying analytical tools and techniques such as Scanning Electron Microscopy, spectrometry and Weibull reliability calculations and by the knowledge of operating temperatures and operational time of each unit, the origin of the problem has now been understood and can be attributed to electromigration. The selected fuse was operated at moderate temperature and load conditions and was considered as a “lifetime” component. However, it turned out to have a smaller than expected MTTF with failures following a Weibull distribution of $\beta = 3.91$ and $\eta = 2323$. The literature describes extensively the effects of electromigration, but there are only limited references referring to the impact of this phenomenon on miniature silver fuses for electronic circuits. |
id | oai-inspirehep.net-1665028 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2017 |
publisher | SISSA |
record_format | invenio |
spelling | oai-inspirehep.net-16650282020-12-14T13:46:14Zdoi:10.22323/1.313.0066http://cds.cern.ch/record/2312400engTrikoupis, NikolaosCasas, JuanPerez Fontenla, Ana TeresaElectromigration driven failures on miniature silver fuses at the Large Hadron ColliderDetectors and Experimental TechniquesSpurious faults were observed on the miniature silver fuses of electronic cards used for the cryogenics instrumentation in the LHC (Large Hadron Collider) accelerator at CERN. By applying analytical tools and techniques such as Scanning Electron Microscopy, spectrometry and Weibull reliability calculations and by the knowledge of operating temperatures and operational time of each unit, the origin of the problem has now been understood and can be attributed to electromigration. The selected fuse was operated at moderate temperature and load conditions and was considered as a “lifetime” component. However, it turned out to have a smaller than expected MTTF with failures following a Weibull distribution of $\beta = 3.91$ and $\eta = 2323$. The literature describes extensively the effects of electromigration, but there are only limited references referring to the impact of this phenomenon on miniature silver fuses for electronic circuits.SISSAoai:inspirehep.net:16650282017 |
spellingShingle | Detectors and Experimental Techniques Trikoupis, Nikolaos Casas, Juan Perez Fontenla, Ana Teresa Electromigration driven failures on miniature silver fuses at the Large Hadron Collider |
title | Electromigration driven failures on miniature silver fuses at the Large Hadron Collider |
title_full | Electromigration driven failures on miniature silver fuses at the Large Hadron Collider |
title_fullStr | Electromigration driven failures on miniature silver fuses at the Large Hadron Collider |
title_full_unstemmed | Electromigration driven failures on miniature silver fuses at the Large Hadron Collider |
title_short | Electromigration driven failures on miniature silver fuses at the Large Hadron Collider |
title_sort | electromigration driven failures on miniature silver fuses at the large hadron collider |
topic | Detectors and Experimental Techniques |
url | https://dx.doi.org/10.22323/1.313.0066 http://cds.cern.ch/record/2312400 |
work_keys_str_mv | AT trikoupisnikolaos electromigrationdrivenfailuresonminiaturesilverfusesatthelargehadroncollider AT casasjuan electromigrationdrivenfailuresonminiaturesilverfusesatthelargehadroncollider AT perezfontenlaanateresa electromigrationdrivenfailuresonminiaturesilverfusesatthelargehadroncollider |