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Electromigration driven failures on miniature silver fuses at the Large Hadron Collider
Spurious faults were observed on the miniature silver fuses of electronic cards used for the cryogenics instrumentation in the LHC (Large Hadron Collider) accelerator at CERN. By applying analytical tools and techniques such as Scanning Electron Microscopy, spectrometry and Weibull reliability calcu...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
SISSA
2017
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.22323/1.313.0066 http://cds.cern.ch/record/2312400 |