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First irradiation test results of the ALICE SAMPA ASIC
With the continuous scaling of the CMOS technology, the CMOS circuits are considered to be more tolerant to Single event Latchup (SEL) effects due to the reduction in the supply voltages. This paper reports the results from SEL testing performed on the first two prototypes for the new readout ASIC (...
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
SISSA
2018
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.22323/1.313.0093 http://cds.cern.ch/record/2312290 |