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Mass-selective ion ejection from multi-reflection time-of-flight devices via a pulsed in-trap lift
A method for high-resolution mass selection is presented which makes use of a multi-reflection time-of-flight mass spectrometer with in-trap lift. The new method needs no additional gating or deflection components. The concept is described in detail and demonstrated with both offline and online meas...
| Autores principales: | , , , , |
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| Lenguaje: | eng |
| Publicado: |
2017
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/j.ijms.2017.07.016 http://cds.cern.ch/record/2314961 |