Mass-selective ion ejection from multi-reflection time-of-flight devices via a pulsed in-trap lift

A method for high-resolution mass selection is presented which makes use of a multi-reflection time-of-flight mass spectrometer with in-trap lift. The new method needs no additional gating or deflection components. The concept is described in detail and demonstrated with both offline and online measurements on short-lived nuclides performed with ISOLTRAP at ISOLDE/CERN.