Mass-selective ion ejection from multi-reflection time-of-flight devices via a pulsed in-trap lift

A method for high-resolution mass selection is presented which makes use of a multi-reflection time-of-flight mass spectrometer with in-trap lift. The new method needs no additional gating or deflection components. The concept is described in detail and demonstrated with both offline and online meas...

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Detalles Bibliográficos
Autores principales: Wienholtz, F, Kreim, S, Rosenbusch, M, Schweikhard, L, Wolf, R N
Lenguaje:eng
Publicado: 2017
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.ijms.2017.07.016
http://cds.cern.ch/record/2314961
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author Wienholtz, F
Kreim, S
Rosenbusch, M
Schweikhard, L
Wolf, R N
author_facet Wienholtz, F
Kreim, S
Rosenbusch, M
Schweikhard, L
Wolf, R N
author_sort Wienholtz, F
collection CERN
description A method for high-resolution mass selection is presented which makes use of a multi-reflection time-of-flight mass spectrometer with in-trap lift. The new method needs no additional gating or deflection components. The concept is described in detail and demonstrated with both offline and online measurements on short-lived nuclides performed with ISOLTRAP at ISOLDE/CERN.
id oai-inspirehep.net-1667565
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2017
record_format invenio
spelling oai-inspirehep.net-16675652019-09-30T06:29:59Zdoi:10.1016/j.ijms.2017.07.016http://cds.cern.ch/record/2314961engWienholtz, FKreim, SRosenbusch, MSchweikhard, LWolf, R NMass-selective ion ejection from multi-reflection time-of-flight devices via a pulsed in-trap liftDetectors and Experimental TechniquesA method for high-resolution mass selection is presented which makes use of a multi-reflection time-of-flight mass spectrometer with in-trap lift. The new method needs no additional gating or deflection components. The concept is described in detail and demonstrated with both offline and online measurements on short-lived nuclides performed with ISOLTRAP at ISOLDE/CERN.oai:inspirehep.net:16675652017
spellingShingle Detectors and Experimental Techniques
Wienholtz, F
Kreim, S
Rosenbusch, M
Schweikhard, L
Wolf, R N
Mass-selective ion ejection from multi-reflection time-of-flight devices via a pulsed in-trap lift
title Mass-selective ion ejection from multi-reflection time-of-flight devices via a pulsed in-trap lift
title_full Mass-selective ion ejection from multi-reflection time-of-flight devices via a pulsed in-trap lift
title_fullStr Mass-selective ion ejection from multi-reflection time-of-flight devices via a pulsed in-trap lift
title_full_unstemmed Mass-selective ion ejection from multi-reflection time-of-flight devices via a pulsed in-trap lift
title_short Mass-selective ion ejection from multi-reflection time-of-flight devices via a pulsed in-trap lift
title_sort mass-selective ion ejection from multi-reflection time-of-flight devices via a pulsed in-trap lift
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/j.ijms.2017.07.016
http://cds.cern.ch/record/2314961
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AT kreims massselectiveionejectionfrommultireflectiontimeofflightdevicesviaapulsedintraplift
AT rosenbuschm massselectiveionejectionfrommultireflectiontimeofflightdevicesviaapulsedintraplift
AT schweikhardl massselectiveionejectionfrommultireflectiontimeofflightdevicesviaapulsedintraplift
AT wolfrn massselectiveionejectionfrommultireflectiontimeofflightdevicesviaapulsedintraplift

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