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RF Design of a High-frequency RFQ Linac for PIXE Analysis

Protons with an energy of few MeV are commonly used for Ion Beam Analysis of materials, in particular with the Proton Induced X-ray Emission technique (PIXE). Because of its non-damaging character, PIXE is used in a variety of fields, in particular for the diagnosis of cultural heritage artwork. A c...

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Detalles Bibliográficos
Autores principales: Pommerenke, Hermann, Bilton, Amy, Grudiev, Alexej, Lombardi, Alessandra, Mathot, Serge, Montesinos, Eric, Timmins, Marc, Vretenar, Maurizio, van Rienen, Ursula
Lenguaje:eng
Publicado: 2018
Materias:
Acceso en línea:https://dx.doi.org/10.18429/JACoW-LINAC2018-THPO058
http://cds.cern.ch/record/2669844