Sensitivity of $^{57}$Fe emission Mössbauer spectroscopy to Ar and C induced defects in ZnO

Emission Mössbauer Spectroscopy (eMS) measurements, following low fluence (<1012 cm−2) implantation of 57Mn (t 1/2 = 1.5 min.) into ZnO single crystals pre-implanted with Ar and C ions, has been utilized to test the sensitivity of the 57Fe eMS technique to the different types of defects generated...

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Detalles Bibliográficos
Autores principales: Bharuth-Ram, K, Mølholt, T E, Langouche, G, Geburt, S, Ronning, C, Doyle, T B, Gunnlaugsson, H P, Johnston, K, Mantovan, R, Masenda, H, Naidoo, D, Ncube, M, Gislason, H, Ólafsson, S, Weyer, G
Lenguaje:eng
Publicado: 2016
Materias:
Physics in General
Acceso en línea:https://dx.doi.org/10.1007/s10751-016-1286-5
http://cds.cern.ch/record/2665643

Internet

https://dx.doi.org/10.1007/s10751-016-1286-5
http://cds.cern.ch/record/2665643

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