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Sensitivity of $^{57}$Fe emission Mössbauer spectroscopy to Ar and C induced defects in ZnO
Emission Mössbauer Spectroscopy (eMS) measurements, following low fluence (<1012 cm−2) implantation of 57Mn (t 1/2 = 1.5 min.) into ZnO single crystals pre-implanted with Ar and C ions, has been utilized to test the sensitivity of the 57Fe eMS technique to the different types of defects generated...
| Autores principales: | , , , , , , , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2016
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/s10751-016-1286-5 http://cds.cern.ch/record/2665643 |