Sensitivity of $^{57}$Fe emission Mössbauer spectroscopy to Ar and C induced defects in ZnO

Emission Mössbauer Spectroscopy (eMS) measurements, following low fluence (<1012 cm−2) implantation of 57Mn (t 1/2 = 1.5 min.) into ZnO single crystals pre-implanted with Ar and C ions, has been utilized to test the sensitivity of the 57Fe eMS technique to the different types of defects generated...

Mô tả đầy đủ

Chi tiết về thư mục
Những tác giả chính: Bharuth-Ram, K, Mølholt, T E, Langouche, G, Geburt, S, Ronning, C, Doyle, T B, Gunnlaugsson, H P, Johnston, K, Mantovan, R, Masenda, H, Naidoo, D, Ncube, M, Gislason, H, Ólafsson, S, Weyer, G
Ngôn ngữ:eng
Được phát hành: 2016
Những chủ đề:
Physics in General
Truy cập trực tuyến:https://dx.doi.org/10.1007/s10751-016-1286-5
http://cds.cern.ch/record/2665643

Internet

https://dx.doi.org/10.1007/s10751-016-1286-5
http://cds.cern.ch/record/2665643

Những quyển sách tương tự