2018 Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics

The sensitivity of a variety of components for particle accelerators electronics has been analyzed against Single Event Effects, Total Ionizing Dose and Displacement Damage. The tested parts include analog, linear, digital and mixed devices.

Detalles Bibliográficos
Autores principales: Danzeca, Salvatore, Foucard, G, Tsiligiannis, G, Ferraro, R, Piscopo, G, McAllister, C G, Borel, T, Peronnard, P, Brugger, M, Masi, A, Gilardoni, S
Lenguaje:eng
Publicado: 2018
Materias:
Accelerators and Storage Rings
Acceso en línea:https://dx.doi.org/10.1109/NSREC.2018.8584266
http://cds.cern.ch/record/2705252

Internet

https://dx.doi.org/10.1109/NSREC.2018.8584266
http://cds.cern.ch/record/2705252

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