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2018 Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics
The sensitivity of a variety of components for particle accelerators electronics has been analyzed against Single Event Effects, Total Ionizing Dose and Displacement Damage. The tested parts include analog, linear, digital and mixed devices.
Autores principales: | Danzeca, Salvatore, Foucard, G, Tsiligiannis, G, Ferraro, R, Piscopo, G, McAllister, C G, Borel, T, Peronnard, P, Brugger, M, Masi, A, Gilardoni, S |
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Lenguaje: | eng |
Publicado: |
2018
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1109/NSREC.2018.8584266 http://cds.cern.ch/record/2705252 |
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