Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation

Heavy-Ion irradiation of a Xilinx Ultrascale+ MPSOC was performed to measure Single-Event-Latch-up and Single-Event-Upset Cross-Sections. Additionally, irradiation with a ultra high energy xenon beam shows similar upset sensitivity.

Detalles Bibliográficos
Autores principales: Glorieux, Maximilien, Evans, Adrian, Lange, Thomas, In, A-Duong, Alexandrescu, Dan, Boatella-Polo, Cesar, Garcia Alía, Rubén, Tali, Maris, Urbina Ortega, Carlos, Kastriotou, Maria, Fernández-Martínez, Pablo, Ferlet-Cavrois, Véronique
Lenguaje:eng
Publicado: 2018
Acceso en línea:https://dx.doi.org/10.1109/NSREC.2018.8584296
http://cds.cern.ch/record/2687312

Internet

https://dx.doi.org/10.1109/NSREC.2018.8584296
http://cds.cern.ch/record/2687312

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