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Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation
Heavy-Ion irradiation of a Xilinx Ultrascale+ MPSOC was performed to measure Single-Event-Latch-up and Single-Event-Upset Cross-Sections. Additionally, irradiation with a ultra high energy xenon beam shows similar upset sensitivity.
| Autores principales: | , , , , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2018
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| Acceso en línea: | https://dx.doi.org/10.1109/NSREC.2018.8584296 http://cds.cern.ch/record/2687312 |
| _version_ | 1780963613438115840 |
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| author | Glorieux, Maximilien Evans, Adrian Lange, Thomas In, A-Duong Alexandrescu, Dan Boatella-Polo, Cesar Garcia Alía, Rubén Tali, Maris Urbina Ortega, Carlos Kastriotou, Maria Fernández-Martínez, Pablo Ferlet-Cavrois, Véronique |
| author_facet | Glorieux, Maximilien Evans, Adrian Lange, Thomas In, A-Duong Alexandrescu, Dan Boatella-Polo, Cesar Garcia Alía, Rubén Tali, Maris Urbina Ortega, Carlos Kastriotou, Maria Fernández-Martínez, Pablo Ferlet-Cavrois, Véronique |
| author_sort | Glorieux, Maximilien |
| collection | CERN |
| description | Heavy-Ion irradiation of a Xilinx Ultrascale+ MPSOC was performed to measure Single-Event-Latch-up and Single-Event-Upset Cross-Sections. Additionally, irradiation with a ultra high energy xenon beam shows similar upset sensitivity. |
| id | oai-inspirehep.net-1744707 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2018 |
| record_format | invenio |
| spelling | oai-inspirehep.net-17447072021-03-26T22:19:07Zdoi:10.1109/NSREC.2018.8584296http://cds.cern.ch/record/2687312engGlorieux, MaximilienEvans, AdrianLange, ThomasIn, A-DuongAlexandrescu, DanBoatella-Polo, CesarGarcia Alía, RubénTali, MarisUrbina Ortega, CarlosKastriotou, MariaFernández-Martínez, PabloFerlet-Cavrois, VéroniqueSingle-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion IrradiationHeavy-Ion irradiation of a Xilinx Ultrascale+ MPSOC was performed to measure Single-Event-Latch-up and Single-Event-Upset Cross-Sections. Additionally, irradiation with a ultra high energy xenon beam shows similar upset sensitivity.oai:inspirehep.net:17447072018 |
| spellingShingle | Glorieux, Maximilien Evans, Adrian Lange, Thomas In, A-Duong Alexandrescu, Dan Boatella-Polo, Cesar Garcia Alía, Rubén Tali, Maris Urbina Ortega, Carlos Kastriotou, Maria Fernández-Martínez, Pablo Ferlet-Cavrois, Véronique Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation |
| title | Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation |
| title_full | Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation |
| title_fullStr | Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation |
| title_full_unstemmed | Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation |
| title_short | Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation |
| title_sort | single-event characterization of xilinx ultrascale+® mpsoc under standard and ultra-high energy heavy-ion irradiation |
| url | https://dx.doi.org/10.1109/NSREC.2018.8584296 http://cds.cern.ch/record/2687312 |
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