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Ultrahigh energy heavy ion test beam on Xilinx Kintex-7 SRAM-based FPGA
In recent years, field-programmable gate array (FPGA) devices have attracted a lot of attentions due to the increasing performance they provide thanks to technology scaling, besides their high flexibility through in-field reprogramming and/or partial reconfiguration capability. However, when such de...
| Autores principales: | , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2019
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/TNS.2019.2915207 http://cds.cern.ch/record/2688397 |