IGBT Power Stack Integrity Assessment Method for High-Power Magnet Supplies

This paper proposes a method for assessing the integrity of a series of insulated-gate bipolar transistor (IGBT) power stacks during factory-acceptance tests and service stops. The key challenge that is addressed in this paper is detecting common assembly issues that affect the power stack thermal p...

Descripción completa

Detalles Bibliográficos
Autores principales: Asimakopoulos, Panagiotis, Papastergiou, Konstantinos, Thiringer, Torbjorn, Bongiorno, Massimo, Le Godec, Gilles
Lenguaje:english
Publicado: 2019
Materias:
Detectors and Experimental Techniques
Accelerators and Storage Rings
Acceso en línea:https://dx.doi.org/10.1109/tpel.2019.2900393
http://cds.cern.ch/record/2693011

Internet

https://dx.doi.org/10.1109/tpel.2019.2900393
http://cds.cern.ch/record/2693011

Ejemplares similares