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IGBT Power Stack Integrity Assessment Method for High-Power Magnet Supplies
This paper proposes a method for assessing the integrity of a series of insulated-gate bipolar transistor (IGBT) power stacks during factory-acceptance tests and service stops. The key challenge that is addressed in this paper is detecting common assembly issues that affect the power stack thermal p...
| Autores principales: | , , , , |
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| Lenguaje: | english |
| Publicado: |
2019
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/tpel.2019.2900393 http://cds.cern.ch/record/2693011 |