Cargando…
Effects of the extraction voltage on the beam divergence for a H$^−$ ion source
Negative hydrogen (H$^−$) ion sources have a wide range of applications. The general requirement for these H$^−$ ion sources is to produce intense H$^−$ ion beams with good beam optics. The purpose of this paper is to clarify the effects of the beam extraction voltage on the beam divergence angle by...
| Autores principales: | , , , , , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
2019
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1063/1.5116413 http://cds.cern.ch/record/2693149 |