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Simulation studies for characterizing ultrashort bunches using novel polarizable X-band transverse deflection structures
Transverse deflection structures are useful devices for characterizing the longitudinal properties of bunches in electron accelerators. With efforts to produce ever-shorter bunches for applications such as external injection into novel accelerator structures, e.g. plasma cells or dielectric structur...
| Autores principales: | , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2019
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1038/s41598-019-56433-8 http://cds.cern.ch/record/2706013 |