Simulation studies for characterizing ultrashort bunches using novel polarizable X-band transverse deflection structures

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Transverse deflection structures are useful devices for characterizing the longitudinal properties of bunches in electron accelerators. With efforts to produce ever-shorter bunches for applications such as external injection into novel accelerator structures, e.g. plasma cells or dielectric structur...

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Detalles Bibliográficos
Autores principales: Marx, Daniel, Assmann, Ralph W, Craievich, Paolo, Floettmann, Klaus, Grudiev, Alexej, Marchetti, Barbara
Lenguaje:eng
Publicado: 2019
Materias:
Accelerators and Storage Rings
Acceso en línea:https://dx.doi.org/10.1038/s41598-019-56433-8
http://cds.cern.ch/record/2706013

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