Cargando…
Sub-micron scale transverse electron beam size diagnostics methodology based on the analysis of optical transition radiation source distribution
Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in numerous facilities worldwide. The resolution of the conventi...
| Autores principales: | , , , , , , , , , , , , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
2020
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1088/1748-0221/15/01/P01020 http://cds.cern.ch/record/2707197 |