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Sub-micron scale transverse electron beam size diagnostics methodology based on the analysis of optical transition radiation source distribution
Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in numerous facilities worldwide. The resolution of the conventi...
Autores principales: | Aryshev, A, Ainsworth, R, Aumeyr, T, Bergamaschi, M, Boogert, S T, Karataev, P, Kieffer, R, Kruchinin, K, Lefevre, T, Mazzoni, S, Nevay, L, Terunuma, N, Urakawa, J |
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Lenguaje: | eng |
Publicado: |
2020
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1088/1748-0221/15/01/P01020 http://cds.cern.ch/record/2707197 |
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