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Low-power SEE hardening techniques and error rate evaluation in 65nm readout ASICs
Single event radiation effects represent one of the main challenges for digital designs exposed to ionizing particles in high energy physics detectors. Radiation hardening techniques are based on redundancy, leading to a significant increase in power consumption and area overhead. This contribution...
| Autores principales: | , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
SISSA
2020
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.22323/1.370.0015 http://cds.cern.ch/record/2724952 |