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Low-power SEE hardening techniques and error rate evaluation in 65nm readout ASICs

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Single event radiation effects represent one of the main challenges for digital designs exposed to ionizing particles in high energy physics detectors. Radiation hardening techniques are based on redundancy, leading to a significant increase in power consumption and area overhead. This contribution...

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Detalles Bibliográficos
Autores principales:	Caratelli, Alessandro, Scarfi, Simone, Bergamin, Gianmario, Ceresa, Davide, Clerq, Jarne De, Kloukinas, Kostas, Leblebici, Yusuf
Lenguaje:	eng
Publicado:	SISSA 2020
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.22323/1.370.0015 http://cds.cern.ch/record/2724952

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